Make all clocks and asynchronous resets come from chip pins during scan mode. Ensure that all scan elements on a scan chain are in the same clock domain. Know the requirements and limitations of your ...

This in-depth discussion of scan-based testing explores the benefits, implementation, and possible problems of AC scan. Today�s large, complex chips present an entirely new set of test issues for ...

Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...